Saturday, May 14, 2022

Personal knowledge of Prof. Dr. Alaa Ahmed Saad Akl

I obtained my PhD. in experimental solid state physics and I worked as a teacher from 22/12/1998 to 24/9/2006 and then I got the degree of associate professor of experimental of solid state physics since 25/9/2006 to 18/11/2013 at the Physics Department, Faculty of Science, Minia University. Since 19/11/2013 I have worked as a professor in experimental solid state physics at the Department of Physics, Faculty of Science, Minia University until now.

Practical experiences

  1. I have experience in preparing thin films in different ways such as thermal  evaporation, sputtering  and chemical spray pyrolysis
  2. I have experience in studying the surface morphology, crystallography, crystal defects, microstructure, optical and electrical properties of alloys and thin films
  3. I have long experience in crystalline materials using XRD and I have experience in the  qualitative and quantitative analysis of inorganic compounds
  4. I worked as Director of the Central Laboratory for Microphysio-Chemical Analysis in Minia University from 6/7/1997 to 26/8/2003. I also managed the Applied Scientific Research Unit, Faculty of Science, Minia University, from 12/10/2012 until 22/9/2014

Research Interest

My major specialization is in Experimental of solid-state physics and specific specialization in materials science in the form of thin films, alloys and surface morphology. My research interests also in the growth and characterization (crystallography, nanostructure, optical, and electrical properties) of metal oxide thin films for thin film device applications such as Electrochromic properties and smart windows. I was trained to grow metal transition oxide thin films (Fe2O3, NiO2, WO3 , V2O5, TiO2, IrO2 and ternary composite (Chalcogniet)  materials as a thin film form and bulk forms) using spray pyrolysis, thermal evaporation, and sputtering (RF) techniques. In parallel, I was experience to characterize, analyzing, and interpret the obtained results from XRD, SEM, AFM, FTIR and UV-VIS-NIR spectrophotometer and optical dispersion analysis of metal transition oxides and other thin films.